NIHAM
NIHAM
Centre of Excellence
NUCLEAR INTERACTIONS AND HADRONIC MATTER
Analog Front-End Electronics
F E E
First Version of the NIHAM FEE ASIC for a High Counting Rate TRD
• the chip is developed in AMS CMOS 0.35 mm technology
• acts as an analog, self triggered front end signal processor
for HCR-TRD
Goals:
• for testing the new HCR TRDs
• for evaluating different solutions for the HCR TRD
front end electronics

Specifications:
■ Number of analog channel: 8
■ Analog channel outputs:
      a) fast semi-Gaussian output signal
     
b) peak-sense output signal
■ In chip pulse generator for testing analog channels
■ Channel self triggered capability
■ Input/Output interface on request/grant basis
Preliminary Results of Tests on TRD Front End Prototype Chip
ASIC test needs an appropriate infrastructure.
It was designed, built and tested:
         - PCB - as chip mounting/bonding base

         - Test Board - for electronic tests of the chip

         - Mother Board - for testing the chip as HCR-TRD FEE
FEE based on FASP for next in-beam tests of Bucharest-Munster TRD prototypes